Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry (Q45243469)
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Language | Label | Description | Also known as |
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English | Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry |
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Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry (English)
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Wagner MS
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1 February 2005
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77
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3
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911-922
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