Scanning tunneling microscopy of defect states in the semiconductorBi2Se3 (Q57773512)
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scholarly article in Physical Review B, vol. 66 no. 16, October 2002
Language | Label | Description | Also known as |
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English | Scanning tunneling microscopy of defect states in the semiconductorBi2Se3 |
scholarly article in Physical Review B, vol. 66 no. 16, October 2002 |
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Scanning tunneling microscopy of defect states in the semiconductorBi2Se3 (English)
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4 October 2002
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66
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16
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