Wafer testing (Q2538844)
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step performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparation
- wafer testing
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Wafer testing |
step performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparation |
|
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1 reference
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Wikipedia(5 entries)
- cawiki Assaig d'oblies
- dewiki Wafertest
- enwiki Wafer testing
- fawiki آزمایش ویفر
- ruwiki Тестирование полупроводниковых пластин