Serial section scanning electron microscopy (S3EM) on silicon wafers for ultra-structural volume imaging of cells and tissues (Q27304657)

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scientific article (publication date: 2012)
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Serial section scanning electron microscopy (S3EM) on silicon wafers for ultra-structural volume imaging of cells and tissues
scientific article (publication date: 2012)

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    Serial section scanning electron microscopy (S3EM) on silicon wafers for ultra-structural volume imaging of cells and tissues (English)
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    Heinz Horstmann
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    Kurt Sätzler
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    Daniel Aydin
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    Thomas Kuner
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    2012
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    7
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    4
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    e35172
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