Quality assessment of atomic force microscopy probes by scanning electron microscopy: correlation of tip structure with rendered images (Q30656786)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Quality assessment of atomic force microscopy probes by scanning electron microscopy: correlation of tip structure with rendered images |
scientific article |
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Quality assessment of atomic force microscopy probes by scanning electron microscopy: correlation of tip structure with rendered images (English)
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Taatjes DJ
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Quinn AS
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Lewis MR
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Bovill EG
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1 March 1999
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44
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312-326
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