A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images (Q30824213)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images |
scientific article |
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A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images (English)
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Lin AC
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Goh MC
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1 February 2002
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205
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Pt 2
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205-208
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