The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois. (Q30978397)
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English | The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois. |
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The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois (English)
Jianguo Wen
James Mabon
Changhui Lei
Steve Burdin
Ernie Sammann
Amish B Shah
Varistha Chobpattana
Jiong Zhang
Ke Ran
Satoshi Mishina
26 February 2010
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