First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy (Q33186954)
Jump to navigation
Jump to search
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy |
scientific article |
Statements
1 reference
First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy (English)
1 reference
Nobuo Tanaka
1 reference
Jun Yamasaki
1 reference
Koji Usuda
1 reference
Nobuyuki Ikarashi
1 reference
1 January 2003
1 reference
1 reference
52
1 reference
69-73
1 reference
Identifiers
1 reference
1 reference