First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy (Q33186954)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy |
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First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy (English)
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Nobuo Tanaka
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Jun Yamasaki
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Koji Usuda
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Nobuyuki Ikarashi
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1 January 2003
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52
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69-73
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