Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal (Q33248992)
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English | Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal |
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Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal (English)
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Dale Rogers
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John Colligon
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Joanna Verran
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16 May 2006
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51
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44-53
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Identifiers
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