Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates (Q33284975)

25 July 2017

title

Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates (English)

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25 July 2017

Marco Beleggia

2

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author name string

Marek Malac

series ordinal

1

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25 July 2017

Ray Egerton

series ordinal

3

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Yimei Zhu

series ordinal

4

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25 July 2017

publication date

31 March 2007

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25 July 2017

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25 July 2017

volume

108

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issue

2

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page(s)

126-140

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Electron microscopy image enhanced

25 July 2017

cites work

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Phase contrast, a new method for the microscopic observation of transparent objects

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High-resolution transmission electron microscopy using negative spherical aberration

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0.23 eV energy resolution obtained using a cold field-emission gun and a streak imaging technique.

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Optimization by Simulated Annealing

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Significance of Electromagnetic Potentials in the Quantum Theory

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Comparison of phase contrast transmission electron microscopy with optimized scanning transmission annular dark field imaging for protein imaging.

7 January 2021

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Radiation damage in the TEM and SEM.

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Beam-induced damage to thin specimens in an intense electron probe.

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Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy

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Identifiers

DOI

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25 July 2017

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