Combined atomic force microscope-based topographical imaging and nanometer-scale resolved proximal probe thermal desorption/electrospray ionization-mass spectrometry (Q33450681)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Combined atomic force microscope-based topographical imaging and nanometer-scale resolved proximal probe thermal desorption/electrospray ionization-mass spectrometry |
scientific article |
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Combined atomic force microscope-based topographical imaging and nanometer-scale resolved proximal probe thermal desorption/electrospray ionization-mass spectrometry (English)
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Olga S Ovchinnikova
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Maxim P Nikiforov
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James A Bradshaw
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Gary J Van Berkel
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6 June 2011
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5526-5531
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Identifiers
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