Automated monitoring to reduce electron microscope downtime (Q33489256)
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Language | Label | Description | Also known as |
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English | Automated monitoring to reduce electron microscope downtime |
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Automated monitoring to reduce electron microscope downtime (English)
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Matthias J Brunner
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Guenter P Resch
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15 July 2009
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109
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11
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1389-1392
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