Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy (Q33499177)
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scientific article published on 2 September 2009
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English | Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy |
scientific article published on 2 September 2009 |
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Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy (English)
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G Gramse
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I Casuso
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J Toset
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2 September 2009
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20
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39
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395702
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