Image quality of microns-thick specimens in the ultra-high voltage electron microscope (Q33536931)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Image quality of microns-thick specimens in the ultra-high voltage electron microscope |
scientific article |
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Image quality of microns-thick specimens in the ultra-high voltage electron microscope (English)
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Fang Wang
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Hai-Bo Zhang
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Meng Cao
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Ryuji Nishi
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Akio Takaoka
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11 February 2010
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41
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490-497
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Identifiers
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