Direct atomic-scale imaging about the mechanisms of ultralarge bent straining in Si nanowires (Q33890404)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Direct atomic-scale imaging about the mechanisms of ultralarge bent straining in Si nanowires |
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Direct atomic-scale imaging about the mechanisms of ultralarge bent straining in Si nanowires (English)
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Lihua Wang
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Kun Zheng
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Ze Zhang
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Xiaodong Han
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5 May 2011
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11
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2382-2385
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