Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging. (Q34186666)
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Language | Label | Description | Also known as |
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English | Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging. |
scientific article |
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Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging (English)
M J Humphry
B Kraus
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