Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application (Q34332426)
Jump to navigation
Jump to search
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application |
scientific article |
Statements
1 reference
Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application (English)
1 reference
1 reference
Emiliano Ronzitti
1 reference
1 reference
Identifiers
1 reference