Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector (Q35225438)
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Language | Label | Description | Also known as |
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English | Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector |
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Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector (English)
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M Pierce
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J Stuart
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A Pungor
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P Dryden
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V Hlady
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1 September 1994
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10
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9
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3217-3221
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Identifiers
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