The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy (Q36604384)
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scientific article published on January 1, 1978
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy |
scientific article published on January 1, 1978 |
Statements
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The use of low temperature X-ray diffraction to evaluate freezing methods used in freeze-fracture electron microscopy (English)
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T. Gulik-Krzywicki
1 January 1978
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Identifiers
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