Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images (Q37260275)
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scientific article published on 15 September 2016
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images |
scientific article published on 15 September 2016 |
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Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images (English)
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Vadim Astakhov
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James C Bouwer
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Thomas J Deerinck
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Eric Bushong
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Ranjan Ramachandra
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Steven T Peltier
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Mark H Ellisman
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15 September 2016
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