Measuring the capacitance of individual semiconductor nanowires for carrier mobility assessment (Q40215083)
Jump to navigation
Jump to search
scientific article published on 8 May 2007
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Measuring the capacitance of individual semiconductor nanowires for carrier mobility assessment |
scientific article published on 8 May 2007 |
Statements
1 reference
Measuring the capacitance of individual semiconductor nanowires for carrier mobility assessment (English)
1 reference
Hongjie Dai
1 reference
Ryan Tu
1 reference
Li Zhang
1 reference
Yoshio Nishi
1 reference
8 May 2007
1 reference
1 reference
7
1 reference
6
1 reference
1561-1565
1 reference
Identifiers
1 reference
1 reference