Detecting particles in cryo-EM micrographs using learned features (Q41628546)
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scientific article published on January 2004
Language | Label | Description | Also known as |
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English | Detecting particles in cryo-EM micrographs using learned features |
scientific article published on January 2004 |
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Detecting particles in cryo-EM micrographs using learned features (English)
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Satya P Mallick
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Yuanxin Zhu
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David Kriegman
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1 January 2004
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145
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1-2
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52-62
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