High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies. (Q42487768)
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scientific article published on 10 July 2010
Language | Label | Description | Also known as |
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English | High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies. |
scientific article published on 10 July 2010 |
Statements
High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies (English)
V N Strocov
T Schmitt
U Flechsig
T Schmidt
A Imhof
Q Chen
R Betemps
D Zimoch
J Krempasky
X Wang
M Grioni
A Piazzalunga
1 reference