The reliability of P50 suppression as measured by the conditioning/testing ratio is vastly improved by dipole modeling (Q43476824)
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scientific article published in March 1993
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English | The reliability of P50 suppression as measured by the conditioning/testing ratio is vastly improved by dipole modeling |
scientific article published in March 1993 |
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The reliability of P50 suppression as measured by the conditioning/testing ratio is vastly improved by dipole modeling (English)
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Cardenas VA
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Gerson J
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Fein G
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1 March 1993
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33
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5
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335-344
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