Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness (Q44125973)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness |
scientific article |
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Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness (English)
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P Keil
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D Lützenkirchen-Hecht
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16 May 2009
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