Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry (Q44867158)
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scientific article published on 30 May 2006
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English | Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry |
scientific article published on 30 May 2006 |
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Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry (English)
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S E Harton
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F A Stevie
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H Ade
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30 May 2006
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17
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8
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1142-1145
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