Sample stacking in CZE using dynamic thermal junctions I. Analytes with low dpKa/dT crossing a single thermally induced pH junction in a BGE with high dpH/dT. (Q46059007)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Sample stacking in CZE using dynamic thermal junctions I. Analytes with low dpKa/dT crossing a single thermally induced pH junction in a BGE with high dpH/dT. |
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Sample stacking in CZE using dynamic thermal junctions I. Analytes with low dpKa/dT crossing a single thermally induced pH junction in a BGE with high dpH/dT. (English)
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Marcos Mandaji
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Gabriel Rübensam
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Rodrigo Barcellos Hoff
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Sandro Hillebrand
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Tarso Ledur Kist
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1 May 2009
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30
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9
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1501-1509
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