Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry (Q46919734)
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scientific article published in January 2006
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English | Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry |
scientific article published in January 2006 |
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Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry (English)
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Olivier Laprévote
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1 January 2006
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20
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4
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703-709
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