Predicting in vivo failure of pseudoelastic NiTi devices under low cycle, high amplitude fatigue. (Q51610423)
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scientific article published in January 2005
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Predicting in vivo failure of pseudoelastic NiTi devices under low cycle, high amplitude fatigue. |
scientific article published in January 2005 |
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Predicting in vivo failure of pseudoelastic NiTi devices under low cycle, high amplitude fatigue. (English)
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Krystyn J Van Vliet
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Jeremy M Young
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1 January 2005
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72
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1
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17-26
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Identifiers
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