Electrical nanoprobing of semiconducting carbon nanotubes using an atomic force microscope. (Q51705974)
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scientific article published on 29 January 2004
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Electrical nanoprobing of semiconducting carbon nanotubes using an atomic force microscope. |
scientific article published on 29 January 2004 |
Statements
Electrical nanoprobing of semiconducting carbon nanotubes using an atomic force microscope. (English)
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Yaish Y
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Park JY
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Rosenblatt S
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Sazonova V
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Brink M
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McEuen PL
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29 January 2004
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92
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4
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046401
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