Time‐of‐flight mass spectrometric analysis of ions produced from adjacent sample spots irradiated simultaneously by a single 337 nm laser (Q51799983)
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scientific article published on January 1, 2003
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English | Time‐of‐flight mass spectrometric analysis of ions produced from adjacent sample spots irradiated simultaneously by a single 337 nm laser |
scientific article published on January 1, 2003 |
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Time‐of‐flight mass spectrometric analysis of ions produced from adjacent sample spots irradiated simultaneously by a single 337 nm laser (English)
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Time-of-flight mass spectrometric analysis of ions produced from adjacent sample spots irradiated simultaneously by a single 337 nm laser (English)
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Michael J. Bogan
1 January 2003
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2557-2562
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