Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching. (Q51811749)
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scientific article published on 16 June 2009
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching. |
scientific article published on 16 June 2009 |
Statements
Advances in TEM orientation microscopy by combination of dark-field conical scanning and improved image matching (English)
Stefan Zaefferer
1 reference
1 reference