A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K. (Q53469263)
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scientific article published in May 2010
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K. |
scientific article published in May 2010 |
Statements
A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K. (English)
Michael Dreyer
Jonghee Lee
Hui Wang
Barry Barker
1 May 2010
81
5
053703
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