A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K. (Q53469263)
Jump to navigation
Jump to search
scientific article published in May 2010
Language | Label | Description | Also known as |
---|---|---|---|
English | A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K. |
scientific article published in May 2010 |
Statements
A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K. (English)
Michael Dreyer
Jonghee Lee
Hui Wang
Barry Barker
1 May 2010
81
5
053703
1 reference
1 reference
1 reference
1 reference
1 reference