Nanoscale quantitative measurement of the potential of charged nanostructures by electrostatic and Kelvin probe force microscopy: unraveling electronic processes in complex materials (Q56988742)
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- Nanoscale Quantitative Measurement of the Potential of Charged Nanostructures by Electrostatic and Kelvin Probe Force Microscopy: Unraveling Electronic Processes in Complex Materials
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| English | Nanoscale quantitative measurement of the potential of charged nanostructures by electrostatic and Kelvin probe force microscopy: unraveling electronic processes in complex materials |
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Nanoscale quantitative measurement of the potential of charged nanostructures by electrostatic and Kelvin probe force microscopy: unraveling electronic processes in complex materials (English)
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Nanoscale Quantitative Measurement of the Potential of Charged Nanostructures by Electrostatic and Kelvin Probe Force Microscopy: Unraveling Electronic Processes in Complex Materials (English)
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20 April 2010
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43
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4
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541-50
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541-550
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1 reference
1 reference