A buckling-based metrology for measuring the elastic moduli of polymeric thin films (Q57134072)
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Language | Label | Description | Also known as |
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English | A buckling-based metrology for measuring the elastic moduli of polymeric thin films |
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A buckling-based metrology for measuring the elastic moduli of polymeric thin films (English)
Christopher Harrison
Kathryn L Beers
Alamgir Karim
Eric J Amis
Mark R VanLandingham
Ho-Cheol Kim
Willi Volksen
Robert D Miller