Image formation, resolution, and height measurement in scanning ion conductance microscopy (Q57255904)
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article by Johannes Rheinlaender & Tilman E. Schäffer published May 2009 in Journal of Applied Physics
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Image formation, resolution, and height measurement in scanning ion conductance microscopy |
article by Johannes Rheinlaender & Tilman E. Schäffer published May 2009 in Journal of Applied Physics |
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Image formation, resolution, and height measurement in scanning ion conductance microscopy (English)
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May 2009
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105
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094905
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