Depth profile of strain and composition in Si∕Ge dot multilayers by microscopic phonon Raman spectroscopy (Q57550086)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Depth profile of strain and composition in Si∕Ge dot multilayers by microscopic phonon Raman spectroscopy |
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Depth profile of strain and composition in Si∕Ge dot multilayers by microscopic phonon Raman spectroscopy (English)
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December 2005
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98
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11
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113517
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