Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy (Q57610733)

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31 January 2020

title

Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy (English)

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1

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Christoph T Koch

3

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31 January 2020

Jaysen Nelayah

4

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31 January 2020

Peter A van Aken

6

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2

Wilfried Sigle

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31 January 2020

author name string

Vesna Srot

5

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publication date

13 May 2009

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31 January 2020

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volume

109

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issue

9

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page(s)

1164-1170

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EFTEM spectrum imaging at high-energy resolution.

31 January 2020

cites work

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Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy

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New techniques in electron energy-loss spectroscopy and energy-filtered imaging

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Formation of guided Cherenkov radiation in silicon-based nanocomposites

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Cerenkov losses: a limit for bandgap determination and Kramers-Kronig analysis

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Band-gap measurements of direct and indirect semiconductors using monochromated electrons

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Filtered dark-field and pure Z-contrast: two novel imaging modes in a Scanning Transmission Electron Microscope

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Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopy

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CombiningGWcalculations with exact-exchange density-functional theory: an analysis of valence-band photoemission for compound semiconductors

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Mapping surface plasmons on a single metallic nanoparticle

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Energy filtered STEM imaging of thick biological sections

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inferred from DOI database lookup

7 January 2021

based on heuristic

Identifiers

DOI

10.1016/J.ULTRAMIC.2009.05.001

1 reference

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31 January 2020

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