Imaging the surface of silica microparticles with the atomic force microscope: a novel sample preparation method (Q57926657)

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Imaging the surface of silica microparticles with the atomic force microscope: a novel sample preparation method
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    Imaging the surface of silica microparticles with the atomic force microscope: a novel sample preparation method (English)
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    K.M Shakesheff
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    M.C Davies
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    D.E Jackson
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    C.J Roberts
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    S.J.B Tendler
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    V.A Brown
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    R.C Watson
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    D.A Barrett
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    P.N Shaw
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    March 1994
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    304
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    1-2
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    L393-L399
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