Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (Q58193377)
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scholarly article by Kenji Takahashi et al published 21 August 2006 in Applied Physics Letters
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Thickness dependence of dielectric properties in bismuth layer-structured dielectrics |
scholarly article by Kenji Takahashi et al published 21 August 2006 in Applied Physics Letters |
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Thickness dependence of dielectric properties in bismuth layer-structured dielectrics (English)
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21 August 2006
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89
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8
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082901
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