Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy (Q58801382)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy |
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Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy (English)
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December 1997
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12
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12
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3219-3224
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