Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy (Q59760613)

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Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
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    Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy (English)
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    K. Takayanagi
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    Y. Tanishiro
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    M. Takahashi
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    S. Takahashi
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    May 1985
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    3
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    3
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    1502-1506
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