Quantitative analysis of strengthening mechanisms in thin Cu films: Effects of film thickness, grain size, and passivation (Q61950450)

From Wikidata
Jump to navigation Jump to search
scientific article published in May 1998
edit
Language Label Description Also known as
English
Quantitative analysis of strengthening mechanisms in thin Cu films: Effects of film thickness, grain size, and passivation
scientific article published in May 1998

    Statements

    Quantitative analysis of strengthening mechanisms in thin Cu films: Effects of film thickness, grain size, and passivation (English)
    0 references
    R-M. Keller
    0 references
    S. P. Baker
    0 references
    May 1998
    0 references
    13
    0 references
    05
    0 references
    1307-1317
    0 references

    Identifiers

    0 references
     
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit
                    edit