High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling (Q62113392)
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scientific article published on 15 June 1998
Language | Label | Description | Also known as |
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English | High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling |
scientific article published on 15 June 1998 |
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High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling (English)
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15 June 1998
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72
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24
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3115-3117
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