High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling (Q62113392)

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scientific article published on 15 June 1998
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High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
scientific article published on 15 June 1998

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    High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling (English)
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    J. A. Veerman
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    A. M. Otter
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    L. Kuipers
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    N. F. van Hulst
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    15 June 1998
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    72
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    24
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    3115-3117
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