Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation (Q62395658)
Jump to navigation
Jump to search
article published in 2002
Language | Label | Description | Also known as |
---|---|---|---|
English | Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation |
article published in 2002 |
Statements
Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation (English)
0 references
March 2002
0 references
188
0 references
3-4
0 references
450-455
0 references