Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope (Q62559067)
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scholarly article by T. M. Smeeton et al published 29 December 2003 in Applied Physics Letters
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope |
scholarly article by T. M. Smeeton et al published 29 December 2003 in Applied Physics Letters |
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Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope (English)
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29 December 2003
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83
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26
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5419-5421
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