Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-Ray Diffraction at High Momentum Transfer (Q62592560)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-Ray Diffraction at High Momentum Transfer |
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Statements
Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transfer (English)
Schülli TU
Zhong Z
Lechner RT
Sztucki M
Metzger TH
13 February 2003
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