A microelectromechanical load sensor for in situ electron and x-ray microscopy tensile testing of nanostructures (Q62855370)

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A microelectromechanical load sensor for in situ electron and x-ray microscopy tensile testing of nanostructures
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    A microelectromechanical load sensor for in situ electron and x-ray microscopy tensile testing of nanostructures (English)
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    Yong Zhu
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    N. Moldovan
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    Horacio D. Espinosa
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    3 January 2005
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    86
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    1
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    013506
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