Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range (Q70242520)
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scientific article published on 01 July 1988
Language | Label | Description | Also known as |
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English | Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range |
scientific article published on 01 July 1988 |
Statements
Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range (English)
W H Aberth