Structural relaxation of Pb defects at the (111)Si/SiO2 interface as a function of oxidation temperature: The Pb-generation-stress relationship (Q74393926)
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scientific article published on 01 July 1993
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Structural relaxation of Pb defects at the (111)Si/SiO2 interface as a function of oxidation temperature: The Pb-generation-stress relationship |
scientific article published on 01 July 1993 |
Statements
Structural relaxation of Pb defects at the (111)Si/SiO2 interface as a function of oxidation temperature: The Pb-generation-stress relationship (English)